A Low-Cost Test Methodology for Dynamic Specification Testing of High-Speed Data Converters.

Shalabh Goyal Abhijit Chatterjee Michael Purtell A Low-Cost Test Methodology for Dynamic Specification Testing of High-Speed Data Converters. 95-106 2007 23 J. Electronic Testing 1 http://dx.doi.org/10.1007/s10836-006-9523-5 db/journals/et/et23.html#GoyalCP07