<?xml version="1.0"?>
<dblp>
<article key="journals/et/GosselCOL04" mdate="2009-03-22">
<author>Michael G&#246;ssel</author>
<author>Krishnendu Chakrabarty</author>
<author>Vitalij Ocheretnij</author>
<author>Andreas Leininger</author>
<title>A Signature Analysis Technique for the Identification of Failing Vectors with Application to Scan-BIST.</title>
<pages>611-622</pages>
<year>2004</year>
<volume>20</volume>
<journal>J. Electronic Testing</journal>
<number>6</number>
<ee>http://dx.doi.org/10.1007/s10677-004-4249-x</ee>
<url>db/journals/et/et20.html#GosselCOL04</url>
</article>
</dblp>
