A New Approach to Single Event Effect Tolerance Based on Asynchronous Circuit Technique.

Rui Gong Wei Chen Fang Liu Kui Dai Zhiying Wang A New Approach to Single Event Effect Tolerance Based on Asynchronous Circuit Technique. 57-65 2008 24 J. Electronic Testing 1-3 http://dx.doi.org/10.1007/s10836-007-5029-z db/journals/et/et24.html#GongCLDW08