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@article{DBLP:journals/et/GongCLDW08,
author = {Rui Gong and
Wei Chen and
Fang Liu and
Kui Dai and
Zhiying Wang},
title = {A New Approach to Single Event Effect Tolerance Based on
Asynchronous Circuit Technique},
journal = {J. Electronic Testing},
volume = {24},
number = {1-3},
year = {2008},
pages = {57-65},
ee = {http://dx.doi.org/10.1007/s10836-007-5029-z},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
Copyright © 2009-03-22 by Michael Ley (ley@uni-trier.de)