BibTeX record: journals/et/GongCLDW08

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@article{DBLP:journals/et/GongCLDW08,
  author    = {Rui Gong and
               Wei Chen and
               Fang Liu and
               Kui Dai and
               Zhiying Wang},
  title     = {A New Approach to Single Event Effect Tolerance Based on Asynchronous
               Circuit Technique},
  journal   = {J. Electronic Testing},
  year      = {2008},
  volume    = {24},
  number    = {1-3},
  pages     = {57--65},
  url       = {http://dx.doi.org/10.1007/s10836-007-5029-z},
  doi       = {10.1007/s10836-007-5029-z},
  timestamp = {Sat, 25 Oct 2014 14:06:57 +0200},
  biburl    = {http://dblp.uni-trier.de/rec/bib/journals/et/GongCLDW08},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}