A Unified DFT Approach for BIST and External Test.

Marie-Lise Flottes Christian Landrault A. Petitqueux A Unified DFT Approach for BIST and External Test. 49-60 2003 19 J. Electronic Testing 1 http://dx.doi.org/10.1023/A:1021943912494 db/journals/et/et19.html#FlottesLP03