<?xml version="1.0"?>
<dblp>
<article key="journals/et/FeigePWTK99" mdate="2009-03-22">
<author>Chris Feige</author>
<author>Jan Ten Pierick</author>
<author>Clemens Wouters</author>
<author>Ronald J. W. T. Tangelder</author>
<author>Hans G. Kerkhoff</author>
<title>Integration of the Scan-Test Method into an Architecture Specific Core-Test Approach.</title>
<pages>125-131</pages>
<year>1999</year>
<volume>14</volume>
<journal>J. Electronic Testing</journal>
<number>1-2</number>
<ee>http://dx.doi.org/10.1023/A:1008313726031</ee>
<url>db/journals/et/et14.html#FeigePWTK99</url>
</article>
</dblp>
