@article{DBLP:journals/et/FeigePWTK99,
  author    = {Chris Feige and
               Jan Ten Pierick and
               Clemens Wouters and
               Ronald J. W. T. Tangelder and
               Hans G. Kerkhoff},
  title     = {Integration of the Scan-Test Method into an Architecture
               Specific Core-Test Approach},
  journal   = {J. Electronic Testing},
  volume    = {14},
  number    = {1-2},
  year      = {1999},
  pages     = {125-131},
  ee        = {http://dx.doi.org/10.1023/A:1008313726031},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}