BibTeX record journals/et/FangH08

download as .bib file

@article{DBLP:journals/et/FangH08,
  author       = {Lei Fang and
                  Michael S. Hsiao},
  title        = {Bilateral Testing of Nano-scale Fault-Tolerant Circuits},
  journal      = {J. Electron. Test.},
  volume       = {24},
  number       = {1-3},
  pages        = {285--296},
  year         = {2008},
  url          = {https://doi.org/10.1007/s10836-007-5041-3},
  doi          = {10.1007/S10836-007-5041-3},
  timestamp    = {Fri, 11 Sep 2020 15:02:50 +0200},
  biburl       = {https://dblp.org/rec/journals/et/FangH08.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.