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BibTeX record journals/et/FangH08
@article{DBLP:journals/et/FangH08, author = {Lei Fang and Michael S. Hsiao}, title = {Bilateral Testing of Nano-scale Fault-Tolerant Circuits}, journal = {J. Electron. Test.}, volume = {24}, number = {1-3}, pages = {285--296}, year = {2008}, url = {https://doi.org/10.1007/s10836-007-5041-3}, doi = {10.1007/S10836-007-5041-3}, timestamp = {Fri, 11 Sep 2020 15:02:50 +0200}, biburl = {https://dblp.org/rec/journals/et/FangH08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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