Innovative Built-In Self-Test Schemes for On-Chip Diagnosis, Compliant with the IEEE 1149.4 Mixed-Signal Test Bus Standard.

Gladys Omayra Ducoudray Jaime Ramírez-Angulo Innovative Built-In Self-Test Schemes for On-Chip Diagnosis, Compliant with the IEEE 1149.4 Mixed-Signal Test Bus Standard. 21-28 2003 19 J. Electronic Testing 1 http://dx.doi.org/10.1023/A:1021987727515 db/journals/et/et19.html#DucoudrayR03