BibTeX record journals/et/DaiWCLCY19

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@article{DBLP:journals/et/DaiWCLCY19,
  author       = {Xixi Dai and
                  Haibin Wang and
                  Jiamin Chu and
                  Zhi Liu and
                  Li Cai and
                  Kang Yan},
  title        = {A Single Event Upset Resilient Latch Design with Single Node Upset
                  Immunity},
  journal      = {J. Electron. Test.},
  volume       = {35},
  number       = {6},
  pages        = {909--916},
  year         = {2019},
  url          = {https://doi.org/10.1007/s10836-019-05823-x},
  doi          = {10.1007/S10836-019-05823-X},
  timestamp    = {Thu, 29 Apr 2021 09:26:55 +0200},
  biburl       = {https://dblp.org/rec/journals/et/DaiWCLCY19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}