BibTeX record journals/et/ChunKK07

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@article{DBLP:journals/et/ChunKK07,
  author       = {Sunghoon Chun and
                  YongJoon Kim and
                  Sungho Kang},
  title        = {{MDSI:} Signal Integrity Interconnect Fault Modeling and Testing for
                  SoCs},
  journal      = {J. Electron. Test.},
  volume       = {23},
  number       = {4},
  pages        = {357--362},
  year         = {2007},
  url          = {https://doi.org/10.1007/s10836-006-0630-0},
  doi          = {10.1007/S10836-006-0630-0},
  timestamp    = {Tue, 27 Feb 2024 16:41:39 +0100},
  biburl       = {https://dblp.org/rec/journals/et/ChunKK07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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