ChunKK07'

BibTeX

@article{DBLP:journals/et/ChunKK07,
  author    = {Sunghoon Chun and
               YongJoon Kim and
               Sungho Kang},
  title     = {MDSI: Signal Integrity Interconnect Fault Modeling and Testing
               for SoCs},
  journal   = {J. Electronic Testing},
  volume    = {23},
  number    = {4},
  year      = {2007},
  pages     = {357-362},
  ee        = {http://dx.doi.org/10.1007/s10836-006-0630-0},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}