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BibTeX record journals/et/ChepelevPRTZLCK18
@article{DBLP:journals/et/ChepelevPRTZLCK18, author = {Vladimir Chepelev and Yury Parfenov and William Radasky and Boris Titov and Leonid Zdoukhov and Kejie Li and Yuhao Chen and Xu Kong and Yan{-}zhao Xie}, title = {Methodical Approach for Immunity Assessment of Electronic Devices Excited by High Power {EMP}}, journal = {J. Electron. Test.}, volume = {34}, number = {5}, pages = {547--557}, year = {2018}, url = {https://doi.org/10.1007/s10836-018-5749-2}, doi = {10.1007/S10836-018-5749-2}, timestamp = {Fri, 11 Sep 2020 15:02:58 +0200}, biburl = {https://dblp.org/rec/journals/et/ChepelevPRTZLCK18.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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