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BibTeX record journals/et/Chakraborty04
@article{DBLP:journals/et/Chakraborty04, author = {Kanad Chakraborty}, title = {Testing and Reliability Techniques for High-Bandwidth Embedded RAMs}, journal = {J. Electron. Test.}, volume = {20}, number = {1}, pages = {89--108}, year = {2004}, url = {https://doi.org/10.1023/B:JETT.0000009316.94309.66}, doi = {10.1023/B:JETT.0000009316.94309.66}, timestamp = {Fri, 11 Sep 2020 15:02:18 +0200}, biburl = {https://dblp.org/rec/journals/et/Chakraborty04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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