BibTeX record journals/et/CaiHWLYYL20

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@article{DBLP:journals/et/CaiHWLYYL20,
  author       = {Shuo Cai and
                  Binyong He and
                  Weizheng Wang and
                  Peng Liu and
                  Fei Yu and
                  Lairong Yin and
                  Bo Li},
  title        = {Soft Error Reliability Evaluation of Nanoscale Logic Circuits in the
                  Presence of Multiple Transient Faults},
  journal      = {J. Electron. Test.},
  volume       = {36},
  number       = {4},
  pages        = {469--483},
  year         = {2020},
  url          = {https://doi.org/10.1007/s10836-020-05898-x},
  doi          = {10.1007/S10836-020-05898-X},
  timestamp    = {Mon, 26 Jun 2023 20:57:55 +0200},
  biburl       = {https://dblp.org/rec/journals/et/CaiHWLYYL20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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