<?xml version="1.0"?>
<dblp>
<article key="journals/et/BounceurMSR07" mdate="2008-03-11">
<author>Ahc&#232;ne Bounceur</author>
<author>Salvador Mir</author>
<author>Emmanuel Simeu</author>
<author>Lu&#237;s Rol&#237;ndez</author>
<title>Estimation of Test Metrics for the Optimisation of Analogue Circuit Testing.</title>
<pages>471-484</pages>
<year>2007</year>
<volume>23</volume>
<journal>J. Electronic Testing</journal>
<number>6</number>
<ee>http://dx.doi.org/10.1007/s10836-007-5006-6</ee>
<url>db/journals/et/et23.html#BounceurMSR07</url>
</article>
</dblp>
