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@article{DBLP:journals/et/BoseAA93,
author = {Soumitra Bose and
Prathima Agrawal and
Vishwani D. Agrawal},
title = {The optimistic update theorem for path delay testing in
sequential circuits},
journal = {J. Electronic Testing},
volume = {4},
number = {3},
year = {1993},
pages = {285-290},
ee = {http://dx.doi.org/10.1007/BF00971977},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
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