Arbitrary Two-Pattern Delay Testing Using a Low-Overhead Supply Gating Technique.

Swarup Bhunia Hamid Mahmoodi Arijit Raychowdhury Kaushik Roy Arbitrary Two-Pattern Delay Testing Using a Low-Overhead Supply Gating Technique. 577-590 2008 24 J. Electronic Testing 6 http://dx.doi.org/10.1007/s10836-008-5072-4 db/journals/et/et24.html#BhuniaMRR08