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@article{DBLP:journals/et/BhuniaMRR08,
author = {Swarup Bhunia and
Hamid Mahmoodi and
Arijit Raychowdhury and
Kaushik Roy},
title = {Arbitrary Two-Pattern Delay Testing Using a Low-Overhead
Supply Gating Technique},
journal = {J. Electronic Testing},
volume = {24},
number = {6},
year = {2008},
pages = {577-590},
ee = {http://dx.doi.org/10.1007/s10836-008-5072-4},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
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