A Selective Scan Slice Encoding Technique for Test Data Volume and Test Power Reduction.

Nabil Badereddine Zhanglei Wang Patrick Girard Krishnendu Chakrabarty Arnaud Virazel Serge Pravossoudovitch Christian Landrault A Selective Scan Slice Encoding Technique for Test Data Volume and Test Power Reduction. 353-364 2008 24 J. Electronic Testing 4 http://dx.doi.org/10.1007/s10836-007-5053-z db/journals/et/et24.html#BadereddineWGCVPL08