BibTeX record journals/eswa/HsiehL08

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@article{DBLP:journals/eswa/HsiehL08,
  author       = {Kun{-}Lin Hsieh and
                  Yen{-}Sheng Lu},
  title        = {Model construction and parameter effect for {TFT-LCD} process based
                  on yield analysis by using ANNs and stepwise regression},
  journal      = {Expert Syst. Appl.},
  volume       = {34},
  number       = {1},
  pages        = {717--724},
  year         = {2008},
  url          = {https://doi.org/10.1016/j.eswa.2006.10.014},
  doi          = {10.1016/J.ESWA.2006.10.014},
  timestamp    = {Fri, 26 May 2017 22:54:10 +0200},
  biburl       = {https://dblp.org/rec/journals/eswa/HsiehL08.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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