<?xml version="1.0"?>
<dblp>
<article key="journals/ese/TurhanMBS09" mdate="2009-12-17">
<author>Burak Turhan</author>
<author>Tim Menzies</author>
<author>Ayse Basar Bener</author>
<author>Justin S. Di Stefano</author>
<title>On the relative value of cross-company and within-company data for defect prediction.</title>
<pages>540-578</pages>
<year>2009</year>
<volume>14</volume>
<journal>Empirical Software Engineering</journal>
<number>5</number>
<ee>http://dx.doi.org/10.1007/s10664-008-9103-7</ee>
<url>db/journals/ese/ese14.html#TurhanMBS09</url>
</article>
</dblp>
