BibTeX record journals/elektrik/DoganaksoySUSA17

download as .bib file

@article{DBLP:journals/elektrik/DoganaksoySUSA17,
  author       = {Ali Doganaksoy and
                  Fatih Sulak and
                  Muhiddin Uguz and
                  Okan Seker and
                  Ziya Akcengiz},
  title        = {Mutual correlation of {NIST} statistical randomness tests and comparison
                  of their sensitivities on transformed sequences},
  journal      = {Turkish J. Electr. Eng. Comput. Sci.},
  volume       = {25},
  pages        = {655--665},
  year         = {2017},
  url          = {https://doi.org/10.3906/elk-1503-214},
  doi          = {10.3906/ELK-1503-214},
  timestamp    = {Wed, 26 May 2021 17:18:49 +0200},
  biburl       = {https://dblp.org/rec/journals/elektrik/DoganaksoySUSA17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics