BibTeX record journals/eaai/ZhangZWL0H23

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@article{DBLP:journals/eaai/ZhangZWL0H23,
  author       = {Zekai Zhang and
                  Mingle Zhou and
                  Honglin Wan and
                  Min Li and
                  Gang Li and
                  Delong Han},
  title        = {IDD-Net: Industrial defect detection method based on Deep-Learning},
  journal      = {Eng. Appl. Artif. Intell.},
  volume       = {123},
  number       = {Part {B}},
  pages        = {106390},
  year         = {2023},
  url          = {https://doi.org/10.1016/j.engappai.2023.106390},
  doi          = {10.1016/J.ENGAPPAI.2023.106390},
  timestamp    = {Sat, 14 Oct 2023 20:14:24 +0200},
  biburl       = {https://dblp.org/rec/journals/eaai/ZhangZWL0H23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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