BibTeX record journals/eaai/OoiSKDC13

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@article{DBLP:journals/eaai/OoiSKDC13,
  author       = {Melanie Po{-}Leen Ooi and
                  Hong Kuan Sok and
                  Ye Chow Kuang and
                  Serge N. Demidenko and
                  Chris Chan},
  title        = {Defect cluster recognition system for fabricated semiconductor wafers},
  journal      = {Eng. Appl. Artif. Intell.},
  volume       = {26},
  number       = {3},
  pages        = {1029--1043},
  year         = {2013},
  url          = {https://doi.org/10.1016/j.engappai.2012.03.016},
  doi          = {10.1016/J.ENGAPPAI.2012.03.016},
  timestamp    = {Sun, 02 Oct 2022 15:33:53 +0200},
  biburl       = {https://dblp.org/rec/journals/eaai/OoiSKDC13.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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