BibTeX record journals/eaai/LiuC13

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@article{DBLP:journals/eaai/LiuC13,
  author       = {Chiao{-}Wen Liu and
                  Chen{-}Fu Chien},
  title        = {An intelligent system for wafer bin map defect diagnosis: An empirical
                  study for semiconductor manufacturing},
  journal      = {Eng. Appl. Artif. Intell.},
  volume       = {26},
  number       = {5-6},
  pages        = {1479--1486},
  year         = {2013},
  url          = {https://doi.org/10.1016/j.engappai.2012.11.009},
  doi          = {10.1016/J.ENGAPPAI.2012.11.009},
  timestamp    = {Tue, 04 Oct 2022 16:42:32 +0200},
  biburl       = {https://dblp.org/rec/journals/eaai/LiuC13.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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