BibTeX record journals/dt/YericCGDSG05

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@article{DBLP:journals/dt/YericCGDSG05,
  author       = {Greg Yeric and
                  Ethan Cohen and
                  John Garcia and
                  Kurt Davis and
                  Esam Salem and
                  Gary Green},
  title        = {Infrastructure for Successful {BEOL} Yield Ramp, Transfer to Manufacturing,
                  and {DFM} Characterization at 65 nm and Below},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {22},
  number       = {3},
  pages        = {232--239},
  year         = {2005},
  url          = {https://doi.org/10.1109/MDT.2005.63},
  doi          = {10.1109/MDT.2005.63},
  timestamp    = {Sun, 17 May 2020 11:44:04 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/YericCGDSG05.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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