David Yeh Li-Shiuan Peh Shekhar Borkar John A. Darringer Anant Agarwal Wen-mei Hwu 272-278 2008 25 IEEE Design & Test of Computers 3 http://dx.doi.org/10.1109/MDT.2008.85 db/journals/dt/dt25.html#YehPBDAH08