<?xml version="1.0"?>
<dblp>
<article key="journals/dt/WangWWWJSG08" mdate="2008-04-28">
<author>Laung-Terng Wang</author>
<author>Xiaoqing Wen</author>
<author>Shianling Wu</author>
<author>Zhigang Wang</author>
<author>Zhigang Jiang</author>
<author>Boryau Sheu</author>
<author>Xinli Gu</author>
<title>VirtualScan: Test Compression Technology Using Combinational Logic and One-Pass ATPG.</title>
<pages>122-130</pages>
<year>2008</year>
<volume>25</volume>
<journal>IEEE Design &amp; Test of Computers</journal>
<number>2</number>
<ee>http://doi.ieeecomputersociety.org/10.1109/MDT.2008.56</ee>
<url>db/journals/dt/dt25.html#WangWWWJSG08</url>
</article>
</dblp>
