<?xml version="1.0"?>
<dblp>
<article key="journals/dt/TyszerRMMKCSL07" mdate="2008-04-28">
<author>Jerzy Tyszer</author>
<author>Janusz Rajski</author>
<author>Grzegorz Mrugalski</author>
<author>Nilanjan Mukherjee</author>
<author>Mark Kassab</author>
<author>Wu-Tung Cheng</author>
<author>Manish Sharma</author>
<author>Liyang Lai</author>
<title>X-Tolerant Compactor with On-Chip Registration and Signature-Based Diagnosis.</title>
<pages>476-485</pages>
<year>2007</year>
<volume>24</volume>
<journal>IEEE Design &amp; Test of Computers</journal>
<number>5</number>
<ee>http://doi.ieeecomputersociety.org/10.1109/MDT.2007.177</ee>
<url>db/journals/dt/dt24.html#TyszerRMMKCSL07</url>
</article>
</dblp>
