<?xml version="1.0"?>
<dblp>
<article key="journals/dt/SemiaoRRPVSTT08" mdate="2009-05-19">
<author>Jorge Semi&#227;o</author>
<author>Marcial Jes&#250;s Rodr&#237;guez-Irago</author>
<author>Juan J. Rodr&#237;guez-Andina</author>
<author>Leonardo Bisch Piccoli</author>
<author>Fabian Vargas</author>
<author>Marcelino Bicho Dos Santos</author>
<author>Isabel Maria Cacho Teixeira</author>
<author>Jo&#227;o Paulo Teixeira</author>
<title>Signal Integrity Enhancement in Digital Circuits.</title>
<pages>452-461</pages>
<year>2008</year>
<volume>25</volume>
<journal>IEEE Design &amp; Test of Computers</journal>
<number>5</number>
<ee>http://dx.doi.org/10.1109/MDT.2008.146</ee>
<url>db/journals/dt/dt25.html#SemiaoRRPVSTT08</url>
</article>
</dblp>
