BibTeX record: journals/dt/SeguraM02

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@article{DBLP:journals/dt/SeguraM02,
  author    = {Jaume Segura and
               Peter C. Maxwell},
  title     = {Guest Editors' Introduction: Defect-Oriented Testing in the Deep-Submicron
               Era},
  journal   = {{IEEE} Design {\&} Test of Computers},
  year      = {2002},
  volume    = {19},
  number    = {5},
  pages     = {5--7},
  url       = {http://doi.ieeecomputersociety.org/10.1109/MDT.2002.1033786},
  doi       = {10.1109/MDT.2002.1033786},
  timestamp = {Thu, 23 Oct 2014 16:42:41 +0200},
  biburl    = {http://dblp.uni-trier.de/rec/bib/journals/dt/SeguraM02},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}