DBLP BibTeX Record 'journals/dt/SeguraM02'

@article{DBLP:journals/dt/SeguraM02,
  author    = {Jaume Segura and
               Peter C. Maxwell},
  title     = {Guest Editors' Introduction: Defect-Oriented Testing in
               the Deep-Submicron Era},
  journal   = {IEEE Design {\&} Test of Computers},
  volume    = {19},
  number    = {5},
  year      = {2002},
  pages     = {5-7},
  ee        = {http://doi.ieeecomputersociety.org/10.1109/MDT.2002.1033786},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}