Santiago Remersaro Xijiang Lin Sudhakar M. Reddy Irith Pomeranz Janusz Rajski Scan-Based Tests with Low Switching Activity. 268-275 2007 24 IEEE Design & Test of Computers 3 http://doi.ieeecomputersociety.org/10.1109/MDT.2007.80 db/journals/dt/dt24.html#RemersaroLRPR07