Janusz Rajski Mark Kassab Nilanjan Mukherjee Nagesh Tamarapalli Jerzy Tyszer Jun Qian Embedded Deterministic Test for Low-Cost Manufacturing. 58-66 2003 20 IEEE Design & Test of Computers 5 http://csdl.computer.org/comp/mags/dt/2003/05/d5058abs.htm db/journals/dt/dt20.html#RajskiKMTTQ03