DBLP Record 'journals/dt/RajskiKMTTQ03'

BibTeX

@article{DBLP:journals/dt/RajskiKMTTQ03,
  author    = {Janusz Rajski and
               Mark Kassab and
               Nilanjan Mukherjee and
               Nagesh Tamarapalli and
               Jerzy Tyszer and
               Jun Qian},
  title     = {Embedded Deterministic Test for Low-Cost Manufacturing},
  journal   = {IEEE Design {\&} Test of Computers},
  volume    = {20},
  number    = {5},
  year      = {2003},
  pages     = {58-66},
  ee        = {http://csdl.computer.org/comp/mags/dt/2003/05/d5058abs.htm},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}