Extracting Defect Density and Size Distributions from Product ICs.

Jeffrey E. Nelson Thomas Zanon Jason G. Brown Osei Poku R. D. (Shawn) Blanton Wojciech Maly Brady Benware Chris Schuermyer Extracting Defect Density and Size Distributions from Product ICs. 390-400 2006 23 IEEE Design & Test of Computers 5 http://doi.ieeecomputersociety.org/10.1109/MDT.2006.117 db/journals/dt/dt23.html#NelsonZBPBMBS06