BibTeX record journals/dt/NelsonZBPBMBS06

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@article{DBLP:journals/dt/NelsonZBPBMBS06,
  author       = {Jeffrey E. Nelson and
                  Thomas Zanon and
                  Jason G. Brown and
                  Osei Poku and
                  R. D. (Shawn) Blanton and
                  Wojciech Maly and
                  Brady Benware and
                  Chris Schuermyer},
  title        = {Extracting Defect Density and Size Distributions from Product ICs},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {23},
  number       = {5},
  pages        = {390--400},
  year         = {2006},
  url          = {https://doi.org/10.1109/MDT.2006.117},
  doi          = {10.1109/MDT.2006.117},
  timestamp    = {Sun, 17 May 2020 11:44:25 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/NelsonZBPBMBS06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}