DBLP Record 'journals/dt/NelsonZBPBMBS06'

BibTeX

@article{DBLP:journals/dt/NelsonZBPBMBS06,
  author    = {Jeffrey E. Nelson and
               Thomas Zanon and
               Jason G. Brown and
               Osei Poku and
               R. D. (Shawn) Blanton and
               Wojciech Maly and
               Brady Benware and
               Chris Schuermyer},
  title     = {Extracting Defect Density and Size Distributions from Product
               ICs},
  journal   = {IEEE Design {\&} Test of Computers},
  volume    = {23},
  number    = {5},
  year      = {2006},
  pages     = {390-400},
  ee        = {http://doi.ieeecomputersociety.org/10.1109/MDT.2006.117},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}