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BibTeX record journals/dt/NaikAM93
@article{DBLP:journals/dt/NaikAM93, author = {Samir Naik and Frank Agricola and Wojciech Maly}, title = {Failure Analysis of High-Density {CMOS} SRAMs: Using Realistic Defect Modeling and I/Sub {DDQ/} Testing}, journal = {{IEEE} Des. Test Comput.}, volume = {10}, number = {2}, pages = {13--23}, year = {1993}, url = {https://doi.org/10.1109/54.211524}, doi = {10.1109/54.211524}, timestamp = {Sun, 17 May 2020 11:44:30 +0200}, biburl = {https://dblp.org/rec/journals/dt/NaikAM93.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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