Pranab K. Nag Anne E. Gattiker Sichao Wei Ronald D. Blanton Wojciech Maly Modeling the Economics of Testing: A DFT Perspective. 29-41 2002 19 IEEE Design & Test of Computers 1 http://doi.ieeecomputersociety.org/10.1109/54.980051 db/journals/dt/dt19.html#NagGWBM02