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@article{DBLP:journals/dt/NagGWBM02,
author = {Pranab K. Nag and
Anne E. Gattiker and
Sichao Wei and
Ronald D. Blanton and
Wojciech Maly},
title = {Modeling the Economics of Testing: A DFT Perspective},
journal = {IEEE Design {\&} Test of Computers},
volume = {19},
number = {1},
year = {2002},
pages = {29-41},
ee = {http://doi.ieeecomputersociety.org/10.1109/54.980051},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
Copyright © 2004-11-09 by Michael Ley (ley@uni-trier.de)