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@article{DBLP:journals/dt/MakKCW04,
author = {T. M. Mak and
Angela Krstic and
Kwang-Ting (Tim) Cheng and
Li-C. Wang},
title = {New Challenges in Delay Testing of Nanometer, Multigigahertz
Designs},
journal = {IEEE Design {\&} Test of Computers},
volume = {21},
number = {3},
year = {2004},
pages = {241-247},
ee = {http://doi.ieeecomputersociety.org/10.1109/MDT.2004.17},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
Copyright © 2005-07-26 by Michael Ley (ley@uni-trier.de)