@article{DBLP:journals/dt/MadgeBD03,
author = {Robert Madge and
Brady Benware and
W. Robert Daasch},
title = {Obtaining High Defect Coverage for Frequency-Dependent Defects
in Complex ASICs},
journal = {IEEE Design {\&} Test of Computers},
volume = {20},
number = {5},
year = {2003},
pages = {46-53},
ee = {http://doi.ieeecomputersociety.org/10.1109/MDT.2003.1232256},
bibsource = {DBLP, http://dblp.uni-trier.de}
}