Xijiang Lin Ron Press Janusz Rajski Paul Reuter Thomas Rinderknecht Bruce Swanson Nagesh Tamarapalli High-Frequency, At-Speed Scan Testing. 17-25 2003 20 IEEE Design & Test of Computers 5 http://csdl.computer.org/comp/mags/dt/2003/05/d5017abs.htm db/journals/dt/dt20.html#LinPRRRST03