BibTeX record journals/dt/KeshavarziTNDDRSH02

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@article{DBLP:journals/dt/KeshavarziTNDDRSH02,
  author       = {Ali Keshavarzi and
                  James W. Tschanz and
                  Siva G. Narendra and
                  Vivek De and
                  W. Robert Daasch and
                  Kaushik Roy and
                  Manoj Sachdev and
                  Charles F. Hawkins},
  title        = {Leakage and Process Variation Effects in Current Testing on Future
                  {CMOS} Circuits},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {19},
  number       = {5},
  pages        = {36--43},
  year         = {2002},
  url          = {https://doi.org/10.1109/MDT.2002.1033790},
  doi          = {10.1109/MDT.2002.1033790},
  timestamp    = {Mon, 28 Feb 2022 17:00:22 +0100},
  biburl       = {https://dblp.org/rec/journals/dt/KeshavarziTNDDRSH02.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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