Yves Joannon Vincent Beroulle Chantal Robach Smail Tedjini Jean-Louis Carbonéro Decreasing Test Qualification Time in AMS and RF Systems. 29-37 2008 25 IEEE Design & Test of Computers 1 http://doi.ieeecomputersociety.org/10.1109/MDT.2008.7 db/journals/dt/dt25.html#JoannonBRTC08