Patrick Girard Christian Landrault Serge Pravossoudovitch Arnaud Virazel Hans-Joachim Wunderlich High Defect Coverage with Low-Power Test Sequences in a BIST Environment. 44-52 2002 19 IEEE Design & Test of Computers 5 http://doi.ieeecomputersociety.org/10.1109/MDT.2002.1033791 db/journals/dt/dt19.html#GirardLPVW02