BibTeX record journals/dt/AbramoviciKMM86

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@article{DBLP:journals/dt/AbramoviciKMM86,
  author       = {Miron Abramovici and
                  James J. Kulikowski and
                  Premachandran R. Menon and
                  David T. Miller},
  title        = {{SMART} and {FAST:} Test Generation for {VLSI} Scan-Design Circuits},
  journal      = {{IEEE} Des. Test},
  volume       = {3},
  number       = {4},
  pages        = {43--54},
  year         = {1986},
  url          = {https://doi.org/10.1109/MDT.1986.294975},
  doi          = {10.1109/MDT.1986.294975},
  timestamp    = {Fri, 05 Mar 2021 08:56:10 +0100},
  biburl       = {https://dblp.org/rec/journals/dt/AbramoviciKMM86.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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