BibTeX record journals/cviu/SobhOJDH95

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@article{DBLP:journals/cviu/SobhOJDH95,
  author       = {Tarek M. Sobh and
                  Jonathan C. Owen and
                  Christopher O. Jaynes and
                  Mohamed Dekhil and
                  Thomas C. Henderson},
  title        = {Industrial Inspection and Reverse Engineering},
  journal      = {Comput. Vis. Image Underst.},
  volume       = {61},
  number       = {3},
  pages        = {468--474},
  year         = {1995},
  url          = {https://doi.org/10.1006/cviu.1995.1035},
  doi          = {10.1006/CVIU.1995.1035},
  timestamp    = {Fri, 21 Feb 2020 21:17:49 +0100},
  biburl       = {https://dblp.org/rec/journals/cviu/SobhOJDH95.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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