BibTeX record journals/corr/abs-2205-12080

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@article{DBLP:journals/corr/abs-2205-12080,
  author       = {Edward Chen and
                  Han Bao and
                  Tate Shorthill and
                  Carl R. Elks and
                  Athira Varma Jayakumar and
                  Nam Dinh},
  title        = {Application of Orthogonal Defect Classification for Software Reliability
                  Analysis},
  journal      = {CoRR},
  volume       = {abs/2205.12080},
  year         = {2022},
  url          = {https://doi.org/10.48550/arXiv.2205.12080},
  doi          = {10.48550/ARXIV.2205.12080},
  eprinttype    = {arXiv},
  eprint       = {2205.12080},
  timestamp    = {Mon, 30 May 2022 15:47:29 +0200},
  biburl       = {https://dblp.org/rec/journals/corr/abs-2205-12080.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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