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DBLP Record 'journals/corr/abs-0710-4763'

BibTeX

@article{DBLP:journals/corr/abs-0710-4763,
  author    = {Matthias Beck and
               Olivier Barondeau and
               Martin Kaibel and
               Frank Poehl and
               Xijiang Lin and
               Ron Press},
  title     = {Logic Design for On-Chip Test Clock Generation - Implementation
               Details and Impact on Delay Test Quality},
  journal   = {CoRR},
  volume    = {abs/0710.4763},
  year      = {2007},
  ee        = {http://arxiv.org/abs/0710.4763},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

Copyright © 2008-01-02 by Michael Ley (ley@uni-trier.de)