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@article{DBLP:journals/corr/abs-0710-4763,
author = {Matthias Beck and
Olivier Barondeau and
Martin Kaibel and
Frank Poehl and
Xijiang Lin and
Ron Press},
title = {Logic Design for On-Chip Test Clock Generation - Implementation
Details and Impact on Delay Test Quality},
journal = {CoRR},
volume = {abs/0710.4763},
year = {2007},
ee = {http://arxiv.org/abs/0710.4763},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
Copyright © 2008-01-02 by Michael Ley (ley@uni-trier.de)