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BibTeX record journals/corr/abs-0710-4763
@article{DBLP:journals/corr/abs-0710-4763, author = {Matthias Beck and Olivier Barondeau and Martin Kaibel and Frank Poehl and Xijiang Lin and Ron Press}, title = {Logic Design for On-Chip Test Clock Generation - Implementation Details and Impact on Delay Test Quality}, journal = {CoRR}, volume = {abs/0710.4763}, year = {2007}, url = {http://arxiv.org/abs/0710.4763}, eprinttype = {arXiv}, eprint = {0710.4763}, timestamp = {Mon, 13 Aug 2018 16:47:40 +0200}, biburl = {https://dblp.org/rec/journals/corr/abs-0710-4763.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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