BibTeX record journals/corr/SinghBM17

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@article{DBLP:journals/corr/SinghBM17,
  author       = {Eshan Singh and
                  Clark W. Barrett and
                  Subhasish Mitra},
  title        = {{E-QED:} Electrical Bug Localization During Post-Silicon Validation
                  Enabled by Quick Error Detection and Formal Methods},
  journal      = {CoRR},
  volume       = {abs/1707.07671},
  year         = {2017},
  url          = {http://arxiv.org/abs/1707.07671},
  eprinttype    = {arXiv},
  eprint       = {1707.07671},
  timestamp    = {Mon, 24 Jun 2019 15:54:17 +0200},
  biburl       = {https://dblp.org/rec/journals/corr/SinghBM17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}